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                                       Details for article 39 of 40 found articles
 
 
  Thermal resistance variation of HBT with high junction temperature and bias condition
 
 
Title: Thermal resistance variation of HBT with high junction temperature and bias condition
Author: Su, Yan-Kuin
Wei, Sun-Chin
Chang, Lee-Sheng
Wang, Ray-Lu
Wang, Charles J.
Appeared in: Solid-state electronics
Paging: Volume 47 (2003) nr. 11 pages 4 p.
Year: 2003
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 39 of 40 found articles
 
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