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Journal description
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Details for article 25 of 46 found articles
| Title: |
Modeling of abnormal capacitance–voltage characteristics observed in MOS transistor with ultra-thin gate oxide |
| Author: |
Hsu, Yung-Lung Fang, Yean-Kuen Tsao, Feng-Cherng Kuo, Fu-Jung Ho, Yens |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 46 (2002) nr. 11 pages 3 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 46 found articles
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