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Journal description
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Details for article 2 of 23 found articles
| Title: |
Analysis of I–V measurements on Ag/p-SnS and Ag/p-SnSe Schottky barriers |
| Author: |
Şafak, Haluk Şahin, Mehmet Faruk Yüksel, Ömer |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 46 (2002) nr. 1 pages 4 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 23 found articles
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