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Journal description
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Details for article 4 of 24 found articles
| Title: |
Comparison of the effects of H2 and D2 plasma exposure on AlGaAs/GaAs high electron mobility transistors |
| Author: |
Luo, B. Ren, F. Lee, K.P. Pearton, S.J. Wu, C.-S. Kopf, R.F. Johnson, D. Sasserah, J.N. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 45 (2001) nr. 9 pages 12 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 24 found articles
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