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Journal description
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Details for article 2 of 35 found articles
| Title: |
A recombination- and trap-assisted tunneling model for stress-induced leakage current |
| Author: |
Ielmini, Daniele Spinelli, Alessandro S. Lacaita, Andrea L. Martinelli, Andrea Ghidini, Gabriella |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 45 (2001) nr. 8 pages 9 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 35 found articles
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