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                                       Details for article 17 of 35 found articles
 
 
  Low voltage and temperature effects on SILC in stressed ultrathin oxide films
 
 
Title: Low voltage and temperature effects on SILC in stressed ultrathin oxide films
Author: Meinertzhagen, A
Zander, D
Petit, C
Jourdain, M
Gogenheim, D
Appeared in: Solid-state electronics
Paging: Volume 45 (2001) nr. 8 pages 11 p.
Year: 2001
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 17 of 35 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands