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Journal description
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Details for article 17 of 30 found articles
| Title: |
Inverse C–V profiling technique for heterostructure semiconductor devices taking account of two-dimensional quantization effect |
| Author: |
Kikuchi, N. Ogawa, M. Miyoshi, T. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 44 (2000) nr. 9 pages 6 p. |
| Year: |
2000 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 30 found articles
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