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                                       Details for article 3 of 20 found articles
 
 
  Cross-sectional STM/STS — a useful tool for identification of dopants in silicon
 
 
Title: Cross-sectional STM/STS — a useful tool for identification of dopants in silicon
Author: Nuffer, R.
Müssig, H.-J.
Dabrowski, J.
Appeared in: Solid-state electronics
Paging: Volume 44 (2000) nr. 5 pages 6 p.
Year: 2000
Contents:
Publisher: Elsevier Science Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 20 found articles
 
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