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                                       Details for article 24 of 31 found articles
 
 
  Scaling of gate length in ultra-short channel heterostructure field effect transistors
 
 
Title: Scaling of gate length in ultra-short channel heterostructure field effect transistors
Author: Han, Jaeheon
Ferry, David K.
Appeared in: Solid-state electronics
Paging: Volume 43 (1999) nr. 2 pages 7 p.
Year: 1999
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 24 of 31 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands