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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 23 of 29 found articles
| Title: |
Low-frequency noise characteristics of hot carrier-stressed buried-channel pMOSFETs |
| Author: |
Jang, Sheng-Lyang Chen, Heng-Kuen Chang, Kow-Ming |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 42 (1998) nr. 3 pages 8 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 23 of 29 found articles
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