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                                       Details for article 20 of 25 found articles
 
 
  Reduced plasma-induced chaging damage in SOI MOSFETs
 
 
Title: Reduced plasma-induced chaging damage in SOI MOSFETs
Author: Sherony, Melanie J.
Antoniadis, Dimitri A.
Chen, Ann J.
Mistry, Kaizad R.
Appeared in: Solid-state electronics
Paging: Volume 41 (1997) nr. 9 pages 3 p.
Year: 1997
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 20 of 25 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands