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Journal description
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Details for article 19 of 22 found articles
| Title: |
Self consistent fitting method for defect analysis by low-frequency noise measurements in reverse biased p-n junctions |
| Author: |
Jevtić, M.M Lazović, M.V |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 41 (1997) nr. 8 pages 5 p. |
| Year: |
1997 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 22 found articles
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