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Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 5 of 47 found articles
| Title: |
Current status of reliability of InGaP/GaAs HBTs |
| Author: |
Ueda, O. Kawano, A. Takahashi, T. Tomioka, T. Fujii, T. Sasa, S. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 41 (1997) nr. 10 pages 6 p. |
| Year: |
1997 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 47 found articles
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