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Journal description
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Details for article 9 of 21 found articles
| Title: |
C-V and G-V characterization of in-situ fabricated Ga2O3GaAs interfaces for inversion/accumulation device and surface passivation applications |
| Author: |
Passlack, M. Hong, M. Mannaerts, J.P. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 39 (1996) nr. 8 pages 4 p. |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 21 found articles
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