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Journal description
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Details for article 6 of 20 found articles
| Title: |
A new lifetime characterization technique using drain current transients in SOI material |
| Author: |
Ionescu, A.M Cristoloveanu, S Munteanu, D Elewa, T Gri, M |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 39 (1996) nr. 12 pages 3 p. |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 6 of 20 found articles
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