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Journal description
All volumes of the corresponding journal
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Details for article 14 of 20 found articles
| Title: |
Hot-carrier-induced degradation in ultra-thin-film fully-depleted SOI MOSFETs |
| Author: |
Yu, Bin Ma, Zhi-Jian Zhang, George Hu, Chenming |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 39 (1996) nr. 12 pages 4 p. |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 20 found articles
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