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                                       Details for article 3 of 20 found articles
 
 
  An improved velocity overshoot model for submicron-gate MESFETs
 
 
Title: An improved velocity overshoot model for submicron-gate MESFETs
Author: Schwierz, F.
Roßerg, M.
Nuernbergk, D.
Schipanski, D.
Förster, H.
Liou, J.J.
Appeared in: Solid-state electronics
Paging: Volume 39 (1996) nr. 10 pages 2 p.
Year: 1996
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 3 of 20 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands