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Journal description
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Details for article 21 of 28 found articles
| Title: |
Representation of two-dimensional ion implantation rest distributions by Pearson distribution curves for silicon technology |
| Author: |
Bowyer, M.D.J. Ashworth, D.G. Oven, R. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 39 (1996) nr. 1 pages 8 p. |
| Year: |
1996 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 21 of 28 found articles
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