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                                       Details for article 4 of 21 found articles
 
 
  A simple and accurate simulation technique for flash EEPROM writing and its reliability issue
 
 
Title: A simple and accurate simulation technique for flash EEPROM writing and its reliability issue
Author: Wen, Kuei-Shan
Wu, Ching-Yuan
Appeared in: Solid-state electronics
Paging: Volume 38 (1995) nr. 7 pages 7 p.
Year: 1995
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 4 of 21 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands