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Journal description
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Details for article 10 of 21 found articles
| Title: |
Dynamic high-current stressing damage and post-stress relaxation in p-n-p silicon bipolar junction transistors |
| Author: |
Jang, S.-L. Liu, S.-S. Tsai, C.-J. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 38 (1995) nr. 7 pages 7 p. |
| Year: |
1995 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 21 found articles
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