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  A leakage current model for sub-micron lightly-doped drain-offset polysilicon TFTs
 
 
Title: A leakage current model for sub-micron lightly-doped drain-offset polysilicon TFTs
Author: Jung, L.
Damiano Jr, J.
Zaman, J.R.
Batra, S.
Manning, M.
Banerjee, S.K.
Appeared in: Solid-state electronics
Paging: Volume 38 (1995) nr. 12 pages 5 p.
Year: 1995
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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 Koninklijke Bibliotheek - National Library of the Netherlands