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Journal description
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Details for article 5 of 23 found articles
| Title: |
A new method for determining the front and back interface trap densities of accumulation mode SOI MOSFETs at 77K |
| Author: |
Martino, J.A Simoen, E Claeys, C |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 38 (1995) nr. 10 pages 5 p. |
| Year: |
1995 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 23 found articles
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