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Journal description
All volumes of the corresponding journal
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Details for article 35 of 44 found articles
| Title: |
Non-destructive technique for estimating gate lengths of MESFETs and HEMTs using low field d.c.-IV data |
| Author: |
Kachwalla, Zain |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 38 (1995) nr. 1 pages 3 p. |
| Year: |
1995 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 35 of 44 found articles
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