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                                       Details for article 10 of 22 found articles
 
 
  Degradation of npn bipolar junction transistors under dynamic high current stress
 
 
Title: Degradation of npn bipolar junction transistors under dynamic high current stress
Author: Jang, Sheng-Lyang
Chang, Ping-Chen
Appeared in: Solid-state electronics
Paging: Volume 37 (1994) nr. 2 pages 7 p.
Year: 1994
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 10 of 22 found articles
 
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