|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 8 of 17 found articles
| Title: |
Hot-carrier degradation in LDD-MOSFETs at high temperatures |
| Author: |
Dikmen, Cemal T. Dogan, Numan S. Osman, Mohamed Bhattacharyya, Arup |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 37 (1994) nr. 12 pages 3 p. |
| Year: |
1994 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 17 found articles
| << previous | next >> |