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Journal description
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Details for article 15 of 23 found articles
| Title: |
Measurement considerations for zero-field time-of-flight studies of minority carrier diffusion in III–V semiconductors |
| Author: |
Lovejoy, M.L. Melloch, M.R. Ahrenkiel, R.K. Lundstrom, M.S. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 35 (1992) nr. 3 pages 9 p. |
| Year: |
1992 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 23 found articles
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