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                                       Details for article 16 of 20 found articles
 
 
  Measurement of the resistance of metal-semiconductor-metal structures using the geometrical magnetoresistance technique
 
 
Title: Measurement of the resistance of metal-semiconductor-metal structures using the geometrical magnetoresistance technique
Author: Wolkenberg, Andrzej
Przesławski, Tomasz
Klamka, Jerzy
Appeared in: Solid-state electronics
Paging: Volume 35 (1992) nr. 1 pages 5 p.
Year: 1992
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 16 of 20 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands