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                                       Details for article 15 of 22 found articles
 
 
  On the nitridation-induced enhancement and degradation of MOSFET characteristics
 
 
Title: On the nitridation-induced enhancement and degradation of MOSFET characteristics
Author: Wong, H.
Cheng, Y.C.
Appeared in: Solid-state electronics
Paging: Volume 33 (1990) nr. 8 pages 3 p.
Year: 1990
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 15 of 22 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands