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Journal description
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Details for article 2 of 16 found articles
| Title: |
A new method for measuring the threshold voltage of small-geometry MOSFETs from subthreshold conduction |
| Author: |
Deen, M.J. Yan, Z.X. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 33 (1990) nr. 5 pages 9 p. |
| Year: |
1990 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 16 found articles
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