|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 4 of 24 found articles
| Title: |
A study of flicker noise in MOS transistors operated at room and liquid helium temperatures |
| Author: |
Hafez, I.M. Ghibaudo, G. Balestra, F. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 33 (1990) nr. 12 pages 5 p. |
| Year: |
1990 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 24 found articles
| << previous | next >> |