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Journal description
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Details for article 2 of 22 found articles
| Title: |
Analytic approach to the a.c. conductance method for rapid characterization of interface states in MOS structures |
| Author: |
Yadava, R.D.S. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 33 (1990) nr. 1 pages 11 p. |
| Year: |
1990 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 2 of 22 found articles
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