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Journal description
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Details for article 4 of 149 found articles
| Title: |
Analysis of defect-assisted tunneling based on low frequency noise measurements of resonant tunnel diodes |
| Author: |
Weichold, M.H. Villareal, S.S. Lux, R.A. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 32 (1989) nr. 12 pages 5 p. |
| Year: |
1989 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 149 found articles
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