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Journal description
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Details for article 15 of 21 found articles
| Title: |
Intrinsic mobility and its surface degradation parameters in narrow channel width PMOS devices at cryogenic temperatures |
| Author: |
Deen, M.J. Wang, J. Hardy, R.H.S. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 32 (1989) nr. 11 pages 4 p. |
| Year: |
1989 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 15 of 21 found articles
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