|
| << previous |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 18 of 18 found articles
| Title: |
Threshold voltage models of the narrow-gate effect in micron and submicron MOSFETs |
| Author: |
Chung, Steve Shao-Shiun Sah, Chih-Tang |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 31 (1988) nr. 6 pages 13 p. |
| Year: |
1988 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 18 of 18 found articles
| << previous |