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                                       Details for article 22 of 23 found articles
 
 
  Temperature behavior and annealing of insulated gate transistors subjected to localized lifetime control by proton implantation
 
 
Title: Temperature behavior and annealing of insulated gate transistors subjected to localized lifetime control by proton implantation
Author: Mogro-Campero, A.
Love, R.P.
Chang, M.F.
Dyer, R.F.
Appeared in: Solid-state electronics
Paging: Volume 30 (1987) nr. 2 pages 4 p.
Year: 1987
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 22 of 23 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands