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  Analysis of the edge region photocapacitance at constant bias in Te-doped Al0.55Ga0.45As
 
 
Title: Analysis of the edge region photocapacitance at constant bias in Te-doped Al0.55Ga0.45As
Author: Morante, J.R.
Samitier, J.
Herms, A.
Cornet, A.
Cartujo, P.
Appeared in: Solid-state electronics
Paging: Volume 29 (1986) nr. 7 pages 8 p.
Year: 1986
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

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 Koninklijke Bibliotheek - National Library of the Netherlands