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Journal description
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Details for article 8 of 16 found articles
| Title: |
Electron trapping in the oxide layer of MIS-type Al Au Ag and Sn-n-type GaAs Schottky barriers |
| Author: |
Laflère, W.H. Van Meirhaeghe, R.L. Cardon, F. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 25 (1982) nr. 5 pages 5 p. |
| Year: |
1982 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 16 found articles
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