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Journal description
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Details for article 16 of 16 found articles
| Title: |
The self-consistent analysis of the on-set of strong inversion in an MOS transistor with double-layer substrate impurity profile |
| Author: |
Yu, Swei-Yam |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 24 (1981) nr. 8 pages 5 p. |
| Year: |
1981 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 16 found articles
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