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                                       Details for article 2 of 10 found articles
 
 
  ANN-based framework for modeling process induced variation using BSIM-CMG unified model
 
 
Title: ANN-based framework for modeling process induced variation using BSIM-CMG unified model
Author: Singhal, Anant
Machhiwar, Yogendra
Kumar, Shashank
Pahwa, Girish
Agarwal, Harshit
Appeared in: Solid-state electronics
Paging: Volume 220 () nr. C pages p.
Year: 2024
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 10 found articles
 
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