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Details for article 25 of 25 found articles
| Title: |
Unveiling the mechanism behind the negative capacitance effect in Hf0.5Zr0.5O2-Based ferroelectric gate stacks and introducing a Circuit-Compatible hybrid compact model for Leakage-Aware NCFETs |
| Author: |
Singh, Khoirom Johnson Acharya, Lomash Chandra Bulusu, Anand Dasgupta, Sudeb |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 216 () nr. C pages p. |
| Year: |
2024 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 25 of 25 found articles
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