|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 10 of 14 found articles
| Title: |
Scanning Probe Microscopy nanoscale electrical characterization of AlGaN/GaN grown on structured GaN templates |
| Author: |
Szyszka, Adam Wośko, Mateusz Stafiniak, Andrzej Prażmowska, Joanna Paszkiewicz, Regina |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 193 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 14 found articles
| << previous | next >> |