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                                       Details for article 2 of 11 found articles
 
 
  Bias dependent physics-based model of low-frequency noise for nanowire type gate-all-around MOSFETs
 
 
Title: Bias dependent physics-based model of low-frequency noise for nanowire type gate-all-around MOSFETs
Author: Yi, Boram
Yang, Geun Soo
Barraud, Sylvain
Bervard, Laurent
Lee, Jae Woo
Yang, Ji-Woon
Appeared in: Solid-state electronics
Paging: Volume 189 () nr. C pages p.
Year: 2022
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 2 of 11 found articles
 
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 Koninklijke Bibliotheek - National Library of the Netherlands