A differential OTP memory based highly unique and reliable PUF at 180 nm technology node
Titel:
A differential OTP memory based highly unique and reliable PUF at 180 nm technology node
Auteur:
Malviya, P. Sadana, S. Lele, A. Priyadarshi, K. Sharma, A. Naik, A. Bandhu, L. Bende, A. Tsundus, S. Kumar, S. Singh, V.P. Chawla, A. Chawla, P. Singh, A. Sehgal, D. Kumar, A. Uddin, W. Chatterjee, S. Suri, M. Jatana, H.S. Ganguly, U.