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Journal description
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Details for article 14 of 35 found articles
| Title: |
Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides |
| Author: |
Celano, U. Lee, Y. Serron, J. Smith, C. Franco, J. Ryu, K. Kim, M. Park, S. Lee, J. Kim, J. van der Heide, P. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 185 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 14 of 35 found articles
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