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Journal description
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Details for article 12 of 16 found articles
| Title: |
On the determination of the minority carrier lifetime from the reverse recovery transient of pnR diodes |
| Author: |
Lewis, David C. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 18 (1975) nr. 1 pages 5 p. |
| Year: |
1975 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 16 found articles
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