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                                       Details for article 6 of 11 found articles
 
 
  Investigation of the anomalous hump phenomenon in amorphous InGaZnO thin-film transistors
 
 
Title: Investigation of the anomalous hump phenomenon in amorphous InGaZnO thin-film transistors
Author: Teng, Tong
Hu, Chun-Feng
Qu, Xin-Ping
Wang, Mingxiang
Appeared in: Solid-state electronics
Paging: Volume 170 () nr. C pages p.
Year: 2020
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 6 of 11 found articles
 
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