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Journal description
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Details for article 4 of 26 found articles
| Title: |
Analysis of fluorine effects on charge-trap flash memory of W/TiN/Al2O3/Si3N4/SiO2/poly-Si gate stack |
| Author: |
Lee, Tae Yoon Lee, Seung Hwan Son, Jun Woo Lee, Sang Jae Bong, Jae Hoon Shin, Eui Joong Kim, Sung Ho Hwang, Wan Sik Moon, Jung Min Choi, Yang Kyu Cho, Byung Jin |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 164 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 26 found articles
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