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Journal description
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Details for article 3 of 19 found articles
| Title: |
Determination of impurity profiles in presence of deep levels by the second-harmonic method |
| Author: |
Schibli, E.G. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 15 (1972) nr. 1 pages 3 p. |
| Year: |
1972 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 3 of 19 found articles
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