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Journal description
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Details for article 8 of 19 found articles
| Title: |
Effect of defect creation and migration on hump characteristics of a-InGaZnO thin film transistors under long-term drain bias stress with light illumination |
| Author: |
Cho, Yong-Jung Kim, Woo-Sic Lee, Yeol-Hyeong Park, Jeong Ki Kim, Geon Tae Kim, Ohyun |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 144 (2018) nr. C pages 95-100 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 8 of 19 found articles
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