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Journal description
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Details for article 16 of 20 found articles
| Title: |
Thermal and optical emission and capture rates and cross sections of electrons and holes at imperfection centers in semiconductors from photo and dark junction current and capacitance experiments |
| Author: |
Sah, C.T. Forbes, L. Rosier, L.L. Tasch Jr., A.F. |
| Appeared in: |
Solid-state electronics |
| Paging: | Volume 13 (1970) nr. 6 pages 30 p. |
| Year: |
1970 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 16 of 20 found articles
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